All these analytic techniques complement each other and yield a comprehensive map of structural, chemical and elemental properties of a specimen.

Hard X-ray microscopy provides a unique opportunity to perform studies of materials at the nanometer scale and offers a suite of techniques such as fluorescence, absorption, differential phase contrast, diffraction and spectroscopy. This achievement opens up opportunities of incorporating a variety of in-situ experiments into ultra high-resolution X-ray microscopy studies. The obtained X-ray wavefront shows excellent agreement with the dynamical calculations, exhibiting aberrations less than 0.3 wave period, which ensures the MLL capable of producing a diffraction-limited focus while offering a sufficient working distance. The reconstructed probe shows a full-width-at-half-maximum (FWHM) peak size of 11.2 nm.Īirmagnet Survey Pro License Cracker more. The focusing performance of a multilayer Laue lens (MLL) with 43.4 μm aperture, 4 nm finest zone width and 4.2 mm focal length at 12 keV was characterized with X-rays using ptychography method.

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